Force Spectroscopy

Force plots measure tip-sample interactions and determine optimal setpoints. More recently, microscopists have plotted force measurements across entire surfaces to reveal new information about the sample. This area of scanning probe microscopy promises to open new chapters in materials science, biology and other investigative areas.

For the theoretical information behind force imaging, refer to Force Plots Explained.

To carry out applications that require examination or control of the tip-sample forces, you will need to be familiar with the Force Plot Parameter Controls used by the NanoScope software.

There are three force capabilities of the Dimension Icon SPM:

• Force Calibration enables the user to carefully control the amount of force with which the probe tip interacts with the sample surface in either Contact or TappingMode.
• Force Modulation allows the user to map the force response across a sample surface.
• Force Volume imaging combines force mapping with topographic AFM imaging.

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